Lifetime and coherence of two-level defects in a Josephson junction.
- DOI
- 10.1103/physrevlett.105.177001
- Published
- 2010 Oct 22
- Container
- Physical review letters
- Publisher
- Not recorded
- Open access
- no
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Cite this work
BibTeX
@article{allodium:10.1103/physrevlett.105.177001,
title = {Lifetime and coherence of two-level defects in a Josephson junction.},
author = {Shalibo Y and Rofe Y and Shwa D and Zeides F and Neeley M and Martinis JM and Katz N},
year = {2010},
journal = {Physical review letters},
doi = {10.1103/physrevlett.105.177001},
url = {https://doi.org/10.1103/physrevlett.105.177001}
}RIS
TY - JOUR TI - Lifetime and coherence of two-level defects in a Josephson junction. AU - Shalibo Y AU - Rofe Y AU - Shwa D AU - Zeides F AU - Neeley M AU - Martinis JM AU - Katz N PY - 2010 JO - Physical review letters DO - 10.1103/physrevlett.105.177001 UR - https://doi.org/10.1103/physrevlett.105.177001 ER -
APA
Y, S., Y, R., D, S., F, Z., M, N., JM, M., & N, K. (2010). Lifetime and coherence of two-level defects in a Josephson junction.. Physical review letters. https://doi.org/10.1103/physrevlett.105.177001
Source records
- pubmed · retrieved 2026-09-25T20:55:19.221Z
- europe-pmc · retrieved 2026-09-25T20:55:19.237Z