Lifetime and coherence of two-level defects in a Josephson junction.

Shalibo Y, Rofe Y, Shwa D, Zeides F, Neeley M, Martinis JM, Katz N

Open source

DOI
10.1103/physrevlett.105.177001
Published
2010 Oct 22
Container
Physical review letters
Publisher
Not recorded
Open access
no

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BibTeX

@article{allodium:10.1103/physrevlett.105.177001,
  title = {Lifetime and coherence of two-level defects in a Josephson junction.},
  author = {Shalibo Y and Rofe Y and Shwa D and Zeides F and Neeley M and Martinis JM and Katz N},
  year = {2010},
  journal = {Physical review letters},
  doi = {10.1103/physrevlett.105.177001},
  url = {https://doi.org/10.1103/physrevlett.105.177001}
}

RIS

TY  - JOUR
TI  - Lifetime and coherence of two-level defects in a Josephson junction.
AU  - Shalibo Y
AU  - Rofe Y
AU  - Shwa D
AU  - Zeides F
AU  - Neeley M
AU  - Martinis JM
AU  - Katz N
PY  - 2010
JO  - Physical review letters
DO  - 10.1103/physrevlett.105.177001
UR  - https://doi.org/10.1103/physrevlett.105.177001
ER  - 

APA

Y, S., Y, R., D, S., F, Z., M, N., JM, M., & N, K. (2010). Lifetime and coherence of two-level defects in a Josephson junction.. Physical review letters. https://doi.org/10.1103/physrevlett.105.177001

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