Direct Characterization of Quantum Measurements Using Weak Values
- DOI
- 10.1103/physrevlett.127.180401
- Published
- 2021-10-28
- Container
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1103/physrevlett.127.180401,
title = {Direct Characterization of Quantum Measurements Using Weak Values},
author = {Liang Xu and Huichao Xu and Tao Jiang and Feixiang Xu and Kaimin Zheng and Ben Wang and Aonan Zhang and Lijian Zhang},
year = {2021},
journal = {Physical Review Letters},
doi = {10.1103/physrevlett.127.180401},
url = {https://doi.org/10.1103/physrevlett.127.180401}
}RIS
TY - JOUR TI - Direct Characterization of Quantum Measurements Using Weak Values AU - Liang Xu AU - Huichao Xu AU - Tao Jiang AU - Feixiang Xu AU - Kaimin Zheng AU - Ben Wang AU - Aonan Zhang AU - Lijian Zhang PY - 2021 JO - Physical Review Letters DO - 10.1103/physrevlett.127.180401 UR - https://doi.org/10.1103/physrevlett.127.180401 ER -
APA
Xu, L., Xu, H., Jiang, T., Xu, F., Zheng, K., Wang, B., Zhang, A., & Zhang, L. (2021). Direct Characterization of Quantum Measurements Using Weak Values. Physical Review Letters. https://doi.org/10.1103/physrevlett.127.180401
Source records
- crossref · retrieved 2026-09-25T08:35:08.236Z