Direct Characterization of Quantum Measurements Using Weak Values

Liang Xu, Huichao Xu, Tao Jiang, Feixiang Xu, Kaimin Zheng, Ben Wang, Aonan Zhang, Lijian Zhang

Open source

DOI
10.1103/physrevlett.127.180401
Published
2021-10-28
Container
Physical Review Letters
Publisher
American Physical Society (APS)
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1103/physrevlett.127.180401,
  title = {Direct Characterization of Quantum Measurements Using Weak Values},
  author = {Liang Xu and Huichao Xu and Tao Jiang and Feixiang Xu and Kaimin Zheng and Ben Wang and Aonan Zhang and Lijian Zhang},
  year = {2021},
  journal = {Physical Review Letters},
  doi = {10.1103/physrevlett.127.180401},
  url = {https://doi.org/10.1103/physrevlett.127.180401}
}

RIS

TY  - JOUR
TI  - Direct Characterization of Quantum Measurements Using Weak Values
AU  - Liang Xu
AU  - Huichao Xu
AU  - Tao Jiang
AU  - Feixiang Xu
AU  - Kaimin Zheng
AU  - Ben Wang
AU  - Aonan Zhang
AU  - Lijian Zhang
PY  - 2021
JO  - Physical Review Letters
DO  - 10.1103/physrevlett.127.180401
UR  - https://doi.org/10.1103/physrevlett.127.180401
ER  - 

APA

Xu, L., Xu, H., Jiang, T., Xu, F., Zheng, K., Wang, B., Zhang, A., & Zhang, L. (2021). Direct Characterization of Quantum Measurements Using Weak Values. Physical Review Letters. https://doi.org/10.1103/physrevlett.127.180401

Source records