Universal finite-size scaling in high-dimensional critical phenomena

Yucheng Liu, Jiwoon Park, Gordon Slade

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DOI: 10.1103/xq7j-zll9
Published: 2026-02-27
Container: Physical Review E
Publisher: American Physical Society (APS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1103/xq7j-zll9,
  title = {Universal finite-size scaling in high-dimensional critical phenomena},
  author = {Yucheng Liu and Jiwoon Park and Gordon Slade},
  year = {2026},
  journal = {Physical Review E},
  doi = {10.1103/xq7j-zll9},
  url = {https://doi.org/10.1103/xq7j-zll9}
}

RIS

TY  - JOUR
TI  - Universal finite-size scaling in high-dimensional critical phenomena
AU  - Yucheng Liu
AU  - Jiwoon Park
AU  - Gordon Slade
PY  - 2026
JO  - Physical Review E
DO  - 10.1103/xq7j-zll9
UR  - https://doi.org/10.1103/xq7j-zll9
ER  -

APA

Liu, Y., Park, J., & Slade, G. (2026). Universal finite-size scaling in high-dimensional critical phenomena. Physical Review E. https://doi.org/10.1103/xq7j-zll9

Source records

crossref · retrieved 2026-09-26T15:21:57.720Z