Enhanced Quantum Metrology by Criticality-Assisted Noncommutative Preparation.

Kong N, Paris MGA, He Q

DOI: 10.1103/xt96-66z1
Published: 2026 Aug 28
Container: Physical review letters
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1103/xt96-66z1,
  title = {Enhanced Quantum Metrology by Criticality-Assisted Noncommutative Preparation.},
  author = {Kong N and Paris MGA and He Q},
  year = {2026},
  journal = {Physical review letters},
  doi = {10.1103/xt96-66z1},
  url = {https://doi.org/10.1103/xt96-66z1}
}

RIS

TY  - JOUR
TI  - Enhanced Quantum Metrology by Criticality-Assisted Noncommutative Preparation.
AU  - Kong N
AU  - Paris MGA
AU  - He Q
PY  - 2026
JO  - Physical review letters
DO  - 10.1103/xt96-66z1
UR  - https://doi.org/10.1103/xt96-66z1
ER  -

APA

N, K., MGA, P., & Q, H. (2026). Enhanced Quantum Metrology by Criticality-Assisted Noncommutative Preparation.. Physical review letters. https://doi.org/10.1103/xt96-66z1

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pubmed · retrieved 2026-09-26T17:03:56.652Z