Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating.

Schumi-Mareček D, Bertram F, Mikulík P, Varshney D, Novák J, Kowarik S

DOI: 10.1107/s1600576724001171
Published: 2024 Apr 1
Container: Journal of applied crystallography
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1107/s1600576724001171,
  title = {Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating.},
  author = {Schumi-Mareček D and Bertram F and Mikulík P and Varshney D and Novák J and Kowarik S},
  year = {2024},
  journal = {Journal of applied crystallography},
  doi = {10.1107/s1600576724001171},
  url = {https://doi.org/10.1107/s1600576724001171}
}

RIS

TY  - JOUR
TI  - Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating.
AU  - Schumi-Mareček D
AU  - Bertram F
AU  - Mikulík P
AU  - Varshney D
AU  - Novák J
AU  - Kowarik S
PY  - 2024
JO  - Journal of applied crystallography
DO  - 10.1107/s1600576724001171
UR  - https://doi.org/10.1107/s1600576724001171
ER  -

APA

D, S., F, B., P, M., D, V., J, N., & S, K. (2024). Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating.. Journal of applied crystallography. https://doi.org/10.1107/s1600576724001171

Source records

pubmed · retrieved 2026-09-26T18:03:32.255Z
europe-pmc · retrieved 2026-09-26T18:03:32.258Z