Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors.

Gasser F, Simbrunner J, Huck M, Moser A, Steinrück HG, Resel R

DOI: 10.1107/s1600576724010628
Published: 2025 Feb 1
Container: Journal of applied crystallography
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1107/s1600576724010628,
  title = {Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors.},
  author = {Gasser F and Simbrunner J and Huck M and Moser A and Steinrück HG and Resel R},
  year = {2025},
  journal = {Journal of applied crystallography},
  doi = {10.1107/s1600576724010628},
  url = {https://doi.org/10.1107/s1600576724010628}
}

RIS

TY  - JOUR
TI  - Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors.
AU  - Gasser F
AU  - Simbrunner J
AU  - Huck M
AU  - Moser A
AU  - Steinrück HG
AU  - Resel R
PY  - 2025
JO  - Journal of applied crystallography
DO  - 10.1107/s1600576724010628
UR  - https://doi.org/10.1107/s1600576724010628
ER  -

APA

F, G., J, S., M, H., A, M., HG, S., & R, R. (2025). Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors.. Journal of applied crystallography. https://doi.org/10.1107/s1600576724010628

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pubmed · retrieved 2026-09-26T11:39:34.192Z