Towards machine-learning-based on-the-fly analysis of neutron reflectometry

Anne Rentzsch, Valentin Munteanu, Oliver Odira Anyanor, Shreya Shah, Philipp Gutfreund, Rémi Perenon, Anthony Martin Higgins, Vladimir Starostin, Alexander Hinderhofer, Dmitry Lapkin, Frank Schreiber

Open source

DOI: 10.1107/s1600576726002657
Published: 2026-05-14
Container: Journal of Applied Crystallography
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1107/s1600576726002657,
  title = {Towards machine-learning-based on-the-fly analysis of neutron reflectometry},
  author = {Anne Rentzsch and Valentin Munteanu and Oliver Odira Anyanor and Shreya Shah and Philipp Gutfreund and Rémi Perenon and Anthony Martin Higgins and Vladimir Starostin and Alexander Hinderhofer and Dmitry Lapkin and Frank Schreiber},
  year = {2026},
  journal = {Journal of Applied Crystallography},
  doi = {10.1107/s1600576726002657},
  url = {https://doi.org/10.1107/s1600576726002657}
}

RIS

TY  - JOUR
TI  - Towards machine-learning-based on-the-fly analysis of neutron reflectometry
AU  - Anne Rentzsch
AU  - Valentin Munteanu
AU  - Oliver Odira Anyanor
AU  - Shreya Shah
AU  - Philipp Gutfreund
AU  - Rémi Perenon
AU  - Anthony Martin Higgins
AU  - Vladimir Starostin
AU  - Alexander Hinderhofer
AU  - Dmitry Lapkin
AU  - Frank Schreiber
PY  - 2026
JO  - Journal of Applied Crystallography
DO  - 10.1107/s1600576726002657
UR  - https://doi.org/10.1107/s1600576726002657
ER  -

APA

Rentzsch, A., Munteanu, V., Anyanor, O. O., Shah, S., Gutfreund, P., Perenon, R., Higgins, A. M., Starostin, V., Hinderhofer, A., Lapkin, D., & Schreiber, F. (2026). Towards machine-learning-based on-the-fly analysis of neutron reflectometry. Journal of Applied Crystallography. https://doi.org/10.1107/s1600576726002657

Source records

crossref · retrieved 2026-09-25T10:58:37.172Z