Microsecond X-ray reflectometry

Michael Haberl, Maximilian Eder, Erwin Pfeiler, David Schumi-Mareček, Florian Bertram, Petr Mikulík, Stefan Kowarik

Open source

DOI: 10.1107/s1600576726004449
Published: 2026-06-24
Container: Journal of Applied Crystallography
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1107/s1600576726004449,
  title = {Microsecond X-ray reflectometry},
  author = {Michael Haberl and Maximilian Eder and Erwin Pfeiler and David Schumi-Mareček and Florian Bertram and Petr Mikulík and Stefan Kowarik},
  year = {2026},
  journal = {Journal of Applied Crystallography},
  doi = {10.1107/s1600576726004449},
  url = {https://doi.org/10.1107/s1600576726004449}
}

RIS

TY  - JOUR
TI  - Microsecond X-ray reflectometry
AU  - Michael Haberl
AU  - Maximilian Eder
AU  - Erwin Pfeiler
AU  - David Schumi-Mareček
AU  - Florian Bertram
AU  - Petr Mikulík
AU  - Stefan Kowarik
PY  - 2026
JO  - Journal of Applied Crystallography
DO  - 10.1107/s1600576726004449
UR  - https://doi.org/10.1107/s1600576726004449
ER  -

APA

Haberl, M., Eder, M., Pfeiler, E., Schumi-Mareček, D., Bertram, F., Mikulík, P., & Kowarik, S. (2026). Microsecond X-ray reflectometry. Journal of Applied Crystallography. https://doi.org/10.1107/s1600576726004449

Source records

crossref · retrieved 2026-09-25T09:30:30.977Z