Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising

Xiaoxu Guo, Dishant Beniwal, Derek McLain, Jonathan Almer, Jun-Sang Park, Peter Kenesei, Hemant Sharma

Open source

DOI: 10.1107/s1600576726007612
Published: 2026-09-15
Container: Journal of Applied Crystallography
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1107/s1600576726007612,
  title = {Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising},
  author = {Xiaoxu Guo and Dishant Beniwal and Derek McLain and Jonathan Almer and Jun-Sang Park and Peter Kenesei and Hemant Sharma},
  year = {2026},
  journal = {Journal of Applied Crystallography},
  doi = {10.1107/s1600576726007612},
  url = {https://doi.org/10.1107/s1600576726007612}
}

RIS

TY  - JOUR
TI  - Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising
AU  - Xiaoxu Guo
AU  - Dishant Beniwal
AU  - Derek McLain
AU  - Jonathan Almer
AU  - Jun-Sang Park
AU  - Peter Kenesei
AU  - Hemant Sharma
PY  - 2026
JO  - Journal of Applied Crystallography
DO  - 10.1107/s1600576726007612
UR  - https://doi.org/10.1107/s1600576726007612
ER  -

APA

Guo, X., Beniwal, D., McLain, D., Almer, J., Park, J., Kenesei, P., & Sharma, H. (2026). Enhancing microstructural fidelity in near-field high-energy diffraction microscopy reconstruction with Noise2Void denoising. Journal of Applied Crystallography. https://doi.org/10.1107/s1600576726007612

Source records

crossref · retrieved 2026-11-10T11:12:51.514Z