Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10(-5) resolution.
- DOI
- 10.1107/s1600577520013211
- Published
- 2021 Jan 1
- Container
- Journal of synchrotron radiation
- Publisher
- Not recorded
- Open access
- unknown
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BibTeX
@article{allodium:10.1107/s1600577520013211,
title = {Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10(-5) resolution.},
author = {Biquard X and Ballet P and Tuaz A and Jouneau PH and Rieutord F},
year = {2021},
journal = {Journal of synchrotron radiation},
doi = {10.1107/s1600577520013211},
url = {https://doi.org/10.1107/s1600577520013211}
}RIS
TY - JOUR TI - Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10(-5) resolution. AU - Biquard X AU - Ballet P AU - Tuaz A AU - Jouneau PH AU - Rieutord F PY - 2021 JO - Journal of synchrotron radiation DO - 10.1107/s1600577520013211 UR - https://doi.org/10.1107/s1600577520013211 ER -
APA
X, B., P, B., A, T., PH, J., & F, R. (2021). Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10(-5) resolution.. Journal of synchrotron radiation. https://doi.org/10.1107/s1600577520013211
Source records
- pubmed · retrieved 2026-09-26T13:16:11.655Z