Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors

Togo Kudo, Shinji Suzuki, Mutsumi Sano, Toshiro Itoga, Hiroyasu Masunaga, Shunji Goto, Sunao Takahashi

Open source

DOI: 10.1107/s1600577525002838
Published: 2025-04-22
Container: Journal of Synchrotron Radiation
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1107/s1600577525002838,
  title = {Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors},
  author = {Togo Kudo and Shinji Suzuki and Mutsumi Sano and Toshiro Itoga and Hiroyasu Masunaga and Shunji Goto and Sunao Takahashi},
  year = {2025},
  journal = {Journal of Synchrotron Radiation},
  doi = {10.1107/s1600577525002838},
  url = {https://doi.org/10.1107/s1600577525002838}
}

RIS

TY  - JOUR
TI  - Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors
AU  - Togo Kudo
AU  - Shinji Suzuki
AU  - Mutsumi Sano
AU  - Toshiro Itoga
AU  - Hiroyasu Masunaga
AU  - Shunji Goto
AU  - Sunao Takahashi
PY  - 2025
JO  - Journal of Synchrotron Radiation
DO  - 10.1107/s1600577525002838
UR  - https://doi.org/10.1107/s1600577525002838
ER  -

APA

Kudo, T., Suzuki, S., Sano, M., Itoga, T., Masunaga, H., Goto, S., & Takahashi, S. (2025). Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors. Journal of Synchrotron Radiation. https://doi.org/10.1107/s1600577525002838

Source records

crossref · retrieved 2026-09-26T02:23:25.848Z