Microstructure analysis of low electron density contrast metallic multilayers using resonant X-ray reflectivity

P. N. Rao, M. K. Swami, H. Srivastava, P. Sahu, A. Ghosh, S. K. Rai

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DOI: 10.1107/s1600577526001827
Published: 2026-04-02
Container: Journal of Synchrotron Radiation
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1107/s1600577526001827,
  title = {Microstructure analysis of low electron density contrast metallic multilayers using resonant X-ray reflectivity},
  author = {P. N. Rao and M. K. Swami and H. Srivastava and P. Sahu and A. Ghosh and S. K. Rai},
  year = {2026},
  journal = {Journal of Synchrotron Radiation},
  doi = {10.1107/s1600577526001827},
  url = {https://doi.org/10.1107/s1600577526001827}
}

RIS

TY  - JOUR
TI  - Microstructure analysis of low electron density contrast metallic multilayers using resonant X-ray reflectivity
AU  - P. N. Rao
AU  - M. K. Swami
AU  - H. Srivastava
AU  - P. Sahu
AU  - A. Ghosh
AU  - S. K. Rai
PY  - 2026
JO  - Journal of Synchrotron Radiation
DO  - 10.1107/s1600577526001827
UR  - https://doi.org/10.1107/s1600577526001827
ER  -

APA

Rao, P. N., Swami, M. K., Srivastava, H., Sahu, P., Ghosh, A., & Rai, S. K. (2026). Microstructure analysis of low electron density contrast metallic multilayers using resonant X-ray reflectivity. Journal of Synchrotron Radiation. https://doi.org/10.1107/s1600577526001827

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crossref · retrieved 2026-09-26T23:34:25.874Z