Wavelength-angle characterization of high-energy X-ray beams from lapped Si(111) double-crystal monochromators using rocking-curve tomography.

Yamazaki H, Tahara K, Shimizu Y, Ohashi H

DOI: 10.1107/s1600577526004972
Published: 2026 Jul 1
Container: Journal of synchrotron radiation
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1107/s1600577526004972,
  title = {Wavelength-angle characterization of high-energy X-ray beams from lapped Si(111) double-crystal monochromators using rocking-curve tomography.},
  author = {Yamazaki H and Tahara K and Shimizu Y and Ohashi H},
  year = {2026},
  journal = {Journal of synchrotron radiation},
  doi = {10.1107/s1600577526004972},
  url = {https://doi.org/10.1107/s1600577526004972}
}

RIS

TY  - JOUR
TI  - Wavelength-angle characterization of high-energy X-ray beams from lapped Si(111) double-crystal monochromators using rocking-curve tomography.
AU  - Yamazaki H
AU  - Tahara K
AU  - Shimizu Y
AU  - Ohashi H
PY  - 2026
JO  - Journal of synchrotron radiation
DO  - 10.1107/s1600577526004972
UR  - https://doi.org/10.1107/s1600577526004972
ER  -

APA

H, Y., K, T., Y, S., & H, O. (2026). Wavelength-angle characterization of high-energy X-ray beams from lapped Si(111) double-crystal monochromators using rocking-curve tomography.. Journal of synchrotron radiation. https://doi.org/10.1107/s1600577526004972

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pubmed · retrieved 2026-09-27T09:52:14.318Z