Monolithic integration of SiC diode detectors into scanning X-ray microscopy optical elements for <i>in situ</i> beam diagnostics

Gabriele Trovato, Simone Finizio, Samuele Moscato, Jörg Raabe, Joakim Reuteler, Massimo Camarda

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DOI: 10.1107/s1600577526007113
Published: 2026-08-05
Container: Journal of Synchrotron Radiation
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1107/s1600577526007113,
  title = {Monolithic integration of SiC diode detectors into scanning X-ray microscopy optical elements for
                    <i>in situ</i>
                    beam diagnostics},
  author = {Gabriele Trovato and Simone Finizio and Samuele Moscato and Jörg Raabe and Joakim Reuteler and Massimo Camarda},
  year = {2026},
  journal = {Journal of Synchrotron Radiation},
  doi = {10.1107/s1600577526007113},
  url = {https://doi.org/10.1107/s1600577526007113}
}

RIS

TY  - JOUR
TI  - Monolithic integration of SiC diode detectors into scanning X-ray microscopy optical elements for
                    <i>in situ</i>
                    beam diagnostics
AU  - Gabriele Trovato
AU  - Simone Finizio
AU  - Samuele Moscato
AU  - Jörg Raabe
AU  - Joakim Reuteler
AU  - Massimo Camarda
PY  - 2026
JO  - Journal of Synchrotron Radiation
DO  - 10.1107/s1600577526007113
UR  - https://doi.org/10.1107/s1600577526007113
ER  -

APA

Trovato, G., Finizio, S., Moscato, S., Raabe, J., Reuteler, J., & Camarda, M. (2026). Monolithic integration of SiC diode detectors into scanning X-ray microscopy optical elements for <i>in situ</i> beam diagnostics. Journal of Synchrotron Radiation. https://doi.org/10.1107/s1600577526007113

Source records

crossref · retrieved 2026-11-10T11:36:46.009Z