Raw diffraction data preservation and reuse: overview, update on practicalities and metadata requirements

Loes M. J. Kroon-Batenburg, John R. Helliwell, Brian McMahon, Thomas C. Terwilliger

Open source

DOI: 10.1107/s2052252516018315
Published: 2017-01-01
Container: IUCrJ
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1107/s2052252516018315,
  title = {Raw diffraction data preservation and reuse: overview, update on practicalities and metadata requirements},
  author = {Loes M. J. Kroon-Batenburg and John R. Helliwell and Brian McMahon and Thomas C. Terwilliger},
  year = {2017},
  journal = {IUCrJ},
  doi = {10.1107/s2052252516018315},
  url = {https://doi.org/10.1107/s2052252516018315}
}

RIS

TY  - JOUR
TI  - Raw diffraction data preservation and reuse: overview, update on practicalities and metadata requirements
AU  - Loes M. J. Kroon-Batenburg
AU  - John R. Helliwell
AU  - Brian McMahon
AU  - Thomas C. Terwilliger
PY  - 2017
JO  - IUCrJ
DO  - 10.1107/s2052252516018315
UR  - https://doi.org/10.1107/s2052252516018315
ER  -

APA

Kroon-Batenburg, L. M. J., Helliwell, J. R., McMahon, B., & Terwilliger, T. C. (2017). Raw diffraction data preservation and reuse: overview, update on practicalities and metadata requirements. IUCrJ. https://doi.org/10.1107/s2052252516018315

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crossref · retrieved 2026-11-04T22:37:41.336Z