A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis

Jasenko Zivanov, Takanori Nakane, Sjors H. W. Scheres

Open source

DOI: 10.1107/s205225251801463x
Published: 2019-01-01
Container: IUCrJ
Publisher: International Union of Crystallography (IUCr)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1107/s205225251801463x,
  title = {A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis},
  author = {Jasenko Zivanov and Takanori Nakane and Sjors H. W. Scheres},
  year = {2019},
  journal = {IUCrJ},
  doi = {10.1107/s205225251801463x},
  url = {https://doi.org/10.1107/s205225251801463x}
}

RIS

TY  - JOUR
TI  - A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis
AU  - Jasenko Zivanov
AU  - Takanori Nakane
AU  - Sjors H. W. Scheres
PY  - 2019
JO  - IUCrJ
DO  - 10.1107/s205225251801463x
UR  - https://doi.org/10.1107/s205225251801463x
ER  -

APA

Zivanov, J., Nakane, T., & Scheres, S. H. W. (2019). A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis. IUCrJ. https://doi.org/10.1107/s205225251801463x

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crossref · retrieved 2026-11-07T08:41:53.466Z