Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law
- DOI
- 10.1107/s205327332001548x
- Published
- 2021-01-01
- Container
- Acta Crystallographica Section A Foundations and Advances
- Publisher
- International Union of Crystallography (IUCr)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1107/s205327332001548x,
title = {Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law},
author = {Vladimir M. Kaganer and Oleg V. Konovalov and Sergio Fernández-Garrido},
year = {2021},
journal = {Acta Crystallographica Section A Foundations and Advances},
doi = {10.1107/s205327332001548x},
url = {https://doi.org/10.1107/s205327332001548x}
}RIS
TY - JOUR TI - Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law AU - Vladimir M. Kaganer AU - Oleg V. Konovalov AU - Sergio Fernández-Garrido PY - 2021 JO - Acta Crystallographica Section A Foundations and Advances DO - 10.1107/s205327332001548x UR - https://doi.org/10.1107/s205327332001548x ER -
APA
Kaganer, V. M., Konovalov, O. V., & Fernández-Garrido, S. (2021). Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law. Acta Crystallographica Section A Foundations and Advances. https://doi.org/10.1107/s205327332001548x
Source records
- crossref · retrieved 2026-11-10T12:41:50.700Z