Random Pattern Testing Versus Deterministic Testing of RAMs
- DOI
- 10.1109/12.24267
- Published
- 1989
- Container
- IEEE Transactions on Computers
- Publisher
- Not recorded
- Open access
- no
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limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1109/12.24267,
title = {Random Pattern Testing Versus Deterministic Testing of RAMs},
author = {R. David and A. Fuentes and B. Courtois},
year = {1989},
journal = {IEEE Transactions on Computers},
doi = {10.1109/12.24267},
url = {https://doi.org/10.1109/12.24267}
}RIS
TY - JOUR TI - Random Pattern Testing Versus Deterministic Testing of RAMs AU - R. David AU - A. Fuentes AU - B. Courtois PY - 1989 JO - IEEE Transactions on Computers DO - 10.1109/12.24267 UR - https://doi.org/10.1109/12.24267 ER -
APA
David, R., Fuentes, A., & Courtois, B. (1989). Random Pattern Testing Versus Deterministic Testing of RAMs. IEEE Transactions on Computers. https://doi.org/10.1109/12.24267
Source records
- hal · retrieved 2026-09-25T04:50:12.673Z