Measurement and control of current/voltage waveforms of microwave transistors using a harmonic load-pull system for the optimum design of high efficiency power amplifiers

D. Barataud, F. Blache, A. Mallet, P.P. Bouysse, J.-M. Nebus, J.P. Villotte, J. Obregon, J. Verspecht, P. Auxemery

Open source

DOI
10.1109/19.779185
Published
1999
Container
IEEE Transactions on Instrumentation and Measurement
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1109/19.779185,
  title = {Measurement and control of current/voltage waveforms of microwave transistors using a harmonic load-pull system for the optimum design of high efficiency power amplifiers},
  author = {D. Barataud and F. Blache and A. Mallet and P.P. Bouysse and J.-M. Nebus and J.P. Villotte and J. Obregon and J. Verspecht and P. Auxemery},
  year = {1999},
  journal = {IEEE Transactions on Instrumentation and Measurement},
  doi = {10.1109/19.779185},
  url = {https://doi.org/10.1109/19.779185}
}

RIS

TY  - JOUR
TI  - Measurement and control of current/voltage waveforms of microwave transistors using a harmonic load-pull system for the optimum design of high efficiency power amplifiers
AU  - D. Barataud
AU  - F. Blache
AU  - A. Mallet
AU  - P.P. Bouysse
AU  - J.-M. Nebus
AU  - J.P. Villotte
AU  - J. Obregon
AU  - J. Verspecht
AU  - P. Auxemery
PY  - 1999
JO  - IEEE Transactions on Instrumentation and Measurement
DO  - 10.1109/19.779185
UR  - https://doi.org/10.1109/19.779185
ER  - 

APA

Barataud, D., Blache, F., Mallet, A., Bouysse, P., Nebus, J., Villotte, J., Obregon, J., Verspecht, J., & Auxemery, P. (1999). Measurement and control of current/voltage waveforms of microwave transistors using a harmonic load-pull system for the optimum design of high efficiency power amplifiers. IEEE Transactions on Instrumentation and Measurement. https://doi.org/10.1109/19.779185

Source records