Nanotechnology for next generation Josephson voltage standards
- DOI
- 10.1109/19.982937
- Published
- 2001-12
- Container
- IEEE Transactions on Instrumentation and Measurement
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
Credibility signals
uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1109/19.982937,
title = {Nanotechnology for next generation Josephson voltage standards},
author = {S.P. Benz and P.D. Dresselhaus and C.J. Burroughs},
year = {2001},
journal = {IEEE Transactions on Instrumentation and Measurement},
doi = {10.1109/19.982937},
url = {https://doi.org/10.1109/19.982937}
}RIS
TY - JOUR TI - Nanotechnology for next generation Josephson voltage standards AU - S.P. Benz AU - P.D. Dresselhaus AU - C.J. Burroughs PY - 2001 JO - IEEE Transactions on Instrumentation and Measurement DO - 10.1109/19.982937 UR - https://doi.org/10.1109/19.982937 ER -
APA
Benz, S., Dresselhaus, P., & Burroughs, C. (2001). Nanotechnology for next generation Josephson voltage standards. IEEE Transactions on Instrumentation and Measurement. https://doi.org/10.1109/19.982937
Source records
- crossref · retrieved 2026-11-07T22:04:25.001Z