Performance limiting micropipe defects in silicon carbide wafers

P.G. Neudeck, J.A. Powell

Open source

DOI
10.1109/55.285372
Published
1994-02
Container
IEEE Electron Device Letters
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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BibTeX

@article{allodium:10.1109/55.285372,
  title = {Performance limiting micropipe defects in silicon carbide wafers},
  author = {P.G. Neudeck and J.A. Powell},
  year = {1994},
  journal = {IEEE Electron Device Letters},
  doi = {10.1109/55.285372},
  url = {https://doi.org/10.1109/55.285372}
}

RIS

TY  - JOUR
TI  - Performance limiting micropipe defects in silicon carbide wafers
AU  - P.G. Neudeck
AU  - J.A. Powell
PY  - 1994
JO  - IEEE Electron Device Letters
DO  - 10.1109/55.285372
UR  - https://doi.org/10.1109/55.285372
ER  -

APA

Neudeck, P., & Powell, J. (1994). Performance limiting micropipe defects in silicon carbide wafers. IEEE Electron Device Letters. https://doi.org/10.1109/55.285372

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