Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines
- DOI
- 10.1109/access.2017.2764474
- Published
- 2017
- Container
- IEEE Access
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/access.2017.2764474,
title = {Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines},
author = {Zhao Xu and Changhua Hu and Feng Yang and Shyh-Hao Kuo and Chi-Keong Goh and Amit Gupta and Sivakumar Nadarajan},
year = {2017},
journal = {IEEE Access},
doi = {10.1109/access.2017.2764474},
url = {https://doi.org/10.1109/access.2017.2764474}
}RIS
TY - JOUR TI - Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines AU - Zhao Xu AU - Changhua Hu AU - Feng Yang AU - Shyh-Hao Kuo AU - Chi-Keong Goh AU - Amit Gupta AU - Sivakumar Nadarajan PY - 2017 JO - IEEE Access DO - 10.1109/access.2017.2764474 UR - https://doi.org/10.1109/access.2017.2764474 ER -
APA
Xu, Z., Hu, C., Yang, F., Kuo, S., Goh, C., Gupta, A., & Nadarajan, S. (2017). Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines. IEEE Access. https://doi.org/10.1109/access.2017.2764474
Source records
- crossref · retrieved 2026-09-27T05:49:37.990Z