A Competing Risk Model of Reliability Analysis for NAND-Based SSDs in Space Application

Peng Li, Wei Dang, Taichun Qin, Zeming Zhang, Congmin Lv

Open source

DOI: 10.1109/access.2019.2899624
Published: 2019
Container: IEEE Access
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1109/access.2019.2899624,
  title = {A Competing Risk Model of Reliability Analysis for NAND-Based SSDs in Space Application},
  author = {Peng Li and Wei Dang and Taichun Qin and Zeming Zhang and Congmin Lv},
  year = {2019},
  journal = {IEEE Access},
  doi = {10.1109/access.2019.2899624},
  url = {https://doi.org/10.1109/access.2019.2899624}
}

RIS

TY  - JOUR
TI  - A Competing Risk Model of Reliability Analysis for NAND-Based SSDs in Space Application
AU  - Peng Li
AU  - Wei Dang
AU  - Taichun Qin
AU  - Zeming Zhang
AU  - Congmin Lv
PY  - 2019
JO  - IEEE Access
DO  - 10.1109/access.2019.2899624
UR  - https://doi.org/10.1109/access.2019.2899624
ER  -

APA

Li, P., Dang, W., Qin, T., Zhang, Z., & Lv, C. (2019). A Competing Risk Model of Reliability Analysis for NAND-Based SSDs in Space Application. IEEE Access. https://doi.org/10.1109/access.2019.2899624

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doaj · retrieved 2026-09-25T12:02:27.410Z