A Comparative Study of Bayesian and Dempster-Shafer Fusion on Image Forgery Detection

Anh-Thu Phan-Ho, Florent Retraint

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DOI: 10.1109/access.2022.3206543
Published: 2022
Container: IEEE Access
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/access.2022.3206543,
  title = {A Comparative Study of Bayesian and Dempster-Shafer Fusion on Image Forgery Detection},
  author = {Anh-Thu Phan-Ho and Florent Retraint},
  year = {2022},
  journal = {IEEE Access},
  doi = {10.1109/access.2022.3206543},
  url = {https://doi.org/10.1109/access.2022.3206543}
}

RIS

TY  - JOUR
TI  - A Comparative Study of Bayesian and Dempster-Shafer Fusion on Image Forgery Detection
AU  - Anh-Thu Phan-Ho
AU  - Florent Retraint
PY  - 2022
JO  - IEEE Access
DO  - 10.1109/access.2022.3206543
UR  - https://doi.org/10.1109/access.2022.3206543
ER  -

APA

Phan-Ho, A., & Retraint, F. (2022). A Comparative Study of Bayesian and Dempster-Shafer Fusion on Image Forgery Detection. IEEE Access. https://doi.org/10.1109/access.2022.3206543

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crossref · retrieved 2026-09-25T13:13:30.282Z