Relaxation Digital-to-Analog Converters Featuring Self-Calibration and Parasitics-Induced Error Suppression in 180-nm CMOS
- DOI
- 10.1109/access.2025.3526209
- Published
- 2025
- Container
- IEEE Access
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/access.2025.3526209,
title = {Relaxation Digital-to-Analog Converters Featuring Self-Calibration and Parasitics-Induced Error Suppression in 180-nm CMOS},
author = {Roberto Rubino and Francesco Musolino and Pedro Toledo and Yong Chen and Anna Richelli and Paolo S. Crovetti},
year = {2025},
journal = {IEEE Access},
doi = {10.1109/access.2025.3526209},
url = {https://doi.org/10.1109/access.2025.3526209}
}RIS
TY - JOUR TI - Relaxation Digital-to-Analog Converters Featuring Self-Calibration and Parasitics-Induced Error Suppression in 180-nm CMOS AU - Roberto Rubino AU - Francesco Musolino AU - Pedro Toledo AU - Yong Chen AU - Anna Richelli AU - Paolo S. Crovetti PY - 2025 JO - IEEE Access DO - 10.1109/access.2025.3526209 UR - https://doi.org/10.1109/access.2025.3526209 ER -
APA
Rubino, R., Musolino, F., Toledo, P., Chen, Y., Richelli, A., & Crovetti, P. S. (2025). Relaxation Digital-to-Analog Converters Featuring Self-Calibration and Parasitics-Induced Error Suppression in 180-nm CMOS. IEEE Access. https://doi.org/10.1109/access.2025.3526209
Source records
- crossref · retrieved 2026-09-25T18:58:49.262Z