A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency
- DOI
- 10.1109/access.2025.3622595
- Published
- 2025
- Container
- IEEE Access
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/access.2025.3622595,
title = {A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency},
author = {Jongho Park and Sangjun Lee and Jaehyun Kim and Hanseong Cho and Nayeun Kim and Sungho Kang},
year = {2025},
journal = {IEEE Access},
doi = {10.1109/access.2025.3622595},
url = {https://doi.org/10.1109/access.2025.3622595}
}RIS
TY - JOUR TI - A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency AU - Jongho Park AU - Sangjun Lee AU - Jaehyun Kim AU - Hanseong Cho AU - Nayeun Kim AU - Sungho Kang PY - 2025 JO - IEEE Access DO - 10.1109/access.2025.3622595 UR - https://doi.org/10.1109/access.2025.3622595 ER -
APA
Park, J., Lee, S., Kim, J., Cho, H., Kim, N., & Kang, S. (2025). A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency. IEEE Access. https://doi.org/10.1109/access.2025.3622595
Source records
- crossref · retrieved 2026-11-06T16:20:16.039Z