Reflected Group Delay of a Capacitively Coupled Resonator for Characterization of Dielectric Constant and Loss Tangent of Microstrip Substrates
- DOI
- 10.1109/access.2026.3664006
- Published
- 2026
- Container
- IEEE Access
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/access.2026.3664006,
title = {Reflected Group Delay of a Capacitively Coupled Resonator for Characterization of Dielectric Constant and Loss Tangent of Microstrip Substrates},
author = {Gaurav Walia and Paul D. Laforge},
year = {2026},
journal = {IEEE Access},
doi = {10.1109/access.2026.3664006},
url = {https://doi.org/10.1109/access.2026.3664006}
}RIS
TY - JOUR TI - Reflected Group Delay of a Capacitively Coupled Resonator for Characterization of Dielectric Constant and Loss Tangent of Microstrip Substrates AU - Gaurav Walia AU - Paul D. Laforge PY - 2026 JO - IEEE Access DO - 10.1109/access.2026.3664006 UR - https://doi.org/10.1109/access.2026.3664006 ER -
APA
Walia, G., & Laforge, P. D. (2026). Reflected Group Delay of a Capacitively Coupled Resonator for Characterization of Dielectric Constant and Loss Tangent of Microstrip Substrates. IEEE Access. https://doi.org/10.1109/access.2026.3664006
Source records
- crossref · retrieved 2026-09-25T02:41:45.665Z