Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements
- DOI
- 10.1109/access.2026.3727918
- Published
- 2026-08-28
- Container
- IEEE Access
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1109/access.2026.3727918,
title = {Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements},
author = {Thalis da Costa Guedes and Jean-Marc Duchamp and Manuel Barragan and Loïc Vincent and Philippe Ferrari},
year = {2026},
journal = {IEEE Access},
doi = {10.1109/access.2026.3727918},
url = {https://doi.org/10.1109/access.2026.3727918}
}RIS
TY - JOUR TI - Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements AU - Thalis da Costa Guedes AU - Jean-Marc Duchamp AU - Manuel Barragan AU - Loïc Vincent AU - Philippe Ferrari PY - 2026 JO - IEEE Access DO - 10.1109/access.2026.3727918 UR - https://doi.org/10.1109/access.2026.3727918 ER -
APA
Guedes, T. D. C., Duchamp, J., Barragan, M., Vincent, L., & Ferrari, P. (2026). Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements. IEEE Access. https://doi.org/10.1109/access.2026.3727918
Source records
- hal · retrieved 2026-09-25T18:06:10.322Z