Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements
- DOI
- 10.1109/access.2026.3727918
- Published
- 2026-08-28
- Container
- IEEE Access
- Publisher
- Not recorded
- Open access
- yes
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BibTeX
@article{allodium:10.1109/access.2026.3727918,
title = {Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements},
author = {Thalis Da Costa Guedes and Johan Bourgeat and Jean-Marc Duchamp and Manuel J. Barragan and Loic Vincent and Philippe Ferrari},
year = {2026},
journal = {IEEE Access},
doi = {10.1109/access.2026.3727918},
url = {https://doi.org/10.1109/access.2026.3727918}
}RIS
TY - JOUR TI - Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements AU - Thalis Da Costa Guedes AU - Johan Bourgeat AU - Jean-Marc Duchamp AU - Manuel J. Barragan AU - Loic Vincent AU - Philippe Ferrari PY - 2026 JO - IEEE Access DO - 10.1109/access.2026.3727918 UR - https://doi.org/10.1109/access.2026.3727918 ER -
APA
Guedes, T. D. C., Bourgeat, J., Duchamp, J., Barragan, M. J., Vincent, L., & Ferrari, P. (2026). Statistical and Central Tendency Analyses of ESD-Induced Degradation in RF Circuits Using Combined ESD/DC/RF Measurements. IEEE Access. https://doi.org/10.1109/access.2026.3727918