Notice of Retraction: 3-D warpage measurement of silicon wafer
- DOI
- 10.1109/aimsec.2011.6010064
- Published
- 2011-08
- Container
- 2011 2nd International Conference on Artificial Intelligence, Management Science and Electronic Commerce (AIMSEC)
- Publisher
- IEEE
- Open access
- unknown
Credibility signals
serious concern Score 29/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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- supportingDOI registered: A matching record was returned by Crossref.
- supportingDOI resolves: A matching record was returned by Crossref.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- serious concernRetraction Watch retraction: 1 retraction notice matched this DOI.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1109/aimsec.2011.6010064,
title = {Notice of Retraction: 3-D warpage measurement of silicon wafer},
author = {Wei Zhang and Fulong Zhu and Shao Song and Honghai Zhang and Sheng liu and Chuanqion Sun},
year = {2011},
journal = {2011 2nd International Conference on Artificial Intelligence, Management Science and Electronic Commerce (AIMSEC)},
doi = {10.1109/aimsec.2011.6010064},
url = {https://doi.org/10.1109/aimsec.2011.6010064}
}RIS
TY - JOUR TI - Notice of Retraction: 3-D warpage measurement of silicon wafer AU - Wei Zhang AU - Fulong Zhu AU - Shao Song AU - Honghai Zhang AU - Sheng liu AU - Chuanqion Sun PY - 2011 JO - 2011 2nd International Conference on Artificial Intelligence, Management Science and Electronic Commerce (AIMSEC) DO - 10.1109/aimsec.2011.6010064 UR - https://doi.org/10.1109/aimsec.2011.6010064 ER -
APA
Zhang, W., Zhu, F., Song, S., Zhang, H., liu, S., & Sun, C. (2011). Notice of Retraction: 3-D warpage measurement of silicon wafer. 2011 2nd International Conference on Artificial Intelligence, Management Science and Electronic Commerce (AIMSEC). https://doi.org/10.1109/aimsec.2011.6010064
Source records
- crossref · retrieved 2026-09-24T21:48:06.199Z