Generalized modular design of testable m-out-of-n code checker
- DOI
- 10.1109/ats.1995.485355
- Published
- Not recorded
- Container
- Proceedings of the Fourth Asian Test Symposium
- Publisher
- IEEE Comput. Soc. Press
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/ats.1995.485355,
title = {Generalized modular design of testable m-out-of-n code checker},
author = {G. Pada Biswas and I. Sen Gupta},
journal = {Proceedings of the Fourth Asian Test Symposium},
doi = {10.1109/ats.1995.485355},
url = {https://doi.org/10.1109/ats.1995.485355}
}RIS
TY - JOUR TI - Generalized modular design of testable m-out-of-n code checker AU - G. Pada Biswas AU - I. Sen Gupta JO - Proceedings of the Fourth Asian Test Symposium DO - 10.1109/ats.1995.485355 UR - https://doi.org/10.1109/ats.1995.485355 ER -
APA
Biswas, G. P., & Gupta, I. S. (n.d.). Generalized modular design of testable m-out-of-n code checker. Proceedings of the Fourth Asian Test Symposium. https://doi.org/10.1109/ats.1995.485355
Source records
- crossref · retrieved 2026-09-27T03:36:30.053Z