A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets

Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard

Open source

DOI
10.1109/ats49688.2020.9301569
Published
2020-11-23
Container
2020 IEEE 29th Asian Test Symposium (ATS)
Publisher
IEEE
Open access
unknown

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BibTeX

@article{allodium:10.1109/ats49688.2020.9301569,
  title = {A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets},
  author = {Aibin Yan and Yan Chen and Jun Zhou and Jie Cui and Tianming Ni and Xiaoqing Wen and Patrick Girard},
  year = {2020},
  journal = {2020 IEEE 29th Asian Test Symposium (ATS)},
  doi = {10.1109/ats49688.2020.9301569},
  url = {https://doi.org/10.1109/ats49688.2020.9301569}
}

RIS

TY  - JOUR
TI  - A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets
AU  - Aibin Yan
AU  - Yan Chen
AU  - Jun Zhou
AU  - Jie Cui
AU  - Tianming Ni
AU  - Xiaoqing Wen
AU  - Patrick Girard
PY  - 2020
JO  - 2020 IEEE 29th Asian Test Symposium (ATS)
DO  - 10.1109/ats49688.2020.9301569
UR  - https://doi.org/10.1109/ats49688.2020.9301569
ER  - 

APA

Yan, A., Chen, Y., Zhou, J., Cui, J., Ni, T., Wen, X., & Girard, P. (2020). A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets. 2020 IEEE 29th Asian Test Symposium (ATS). https://doi.org/10.1109/ats49688.2020.9301569

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