Full-waveform measuring system for lightning current caused by lightning strikes to tall structures

Gao Cheng, Shi Lihua, Chen Bin, Zhang Gongcheng, Zhou Bihua, Chen Ziming

Open source

DOI
10.1109/ceem.2000.853961
Published
Not recorded
Container
Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)
Publisher
Beijing Univ. Posts & Telecommun. Press
Open access
unknown

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BibTeX

@article{allodium:10.1109/ceem.2000.853961,
  title = {Full-waveform measuring system for lightning current caused by lightning strikes to tall structures},
  author = {Gao Cheng and Shi Lihua and Chen Bin and Zhang Gongcheng and Zhou Bihua and Chen Ziming},
  journal = {Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)},
  doi = {10.1109/ceem.2000.853961},
  url = {https://doi.org/10.1109/ceem.2000.853961}
}

RIS

TY  - JOUR
TI  - Full-waveform measuring system for lightning current caused by lightning strikes to tall structures
AU  - Gao Cheng
AU  - Shi Lihua
AU  - Chen Bin
AU  - Zhang Gongcheng
AU  - Zhou Bihua
AU  - Chen Ziming
JO  - Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)
DO  - 10.1109/ceem.2000.853961
UR  - https://doi.org/10.1109/ceem.2000.853961
ER  - 

APA

Cheng, G., Lihua, S., Bin, C., Gongcheng, Z., Bihua, Z., & Ziming, C. (n.d.). Full-waveform measuring system for lightning current caused by lightning strikes to tall structures. Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402). https://doi.org/10.1109/ceem.2000.853961

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