BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits
- DOI
- 10.1109/date.2007.364477
- Published
- 2007-04-16
- Container
- Not recorded
- Publisher
- IEEE
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1109/date.2007.364477,
title = {BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits},
author = {Amir Zjajo and Manuel J. Barragan and Jose Pineda de Gyvez},
year = {2007},
doi = {10.1109/date.2007.364477},
url = {https://doi.org/10.1109/date.2007.364477}
}RIS
TY - JOUR TI - BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits AU - Amir Zjajo AU - Manuel J. Barragan AU - Jose Pineda de Gyvez PY - 2007 DO - 10.1109/date.2007.364477 UR - https://doi.org/10.1109/date.2007.364477 ER -
APA
Zjajo, A., Barragan, M. J., & Gyvez, J. P. D. (2007). BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits. https://doi.org/10.1109/date.2007.364477
Source records
- hal · retrieved 2026-09-27T07:23:40.558Z