Scan-chain intra-cell defects grading
- DOI
- 10.1109/dtis.2015.7127349
- Published
- 2015-04
- Container
- 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/dtis.2015.7127349,
title = {Scan-chain intra-cell defects grading},
author = {A. Touati and A. Bosio and L. Dilillo and P. Girard and A. Virazel and P. Bernardi and M. Sonza Reorda},
year = {2015},
journal = {2015 10th International Conference on Design \& Technology of Integrated Systems in Nanoscale Era (DTIS)},
doi = {10.1109/dtis.2015.7127349},
url = {https://doi.org/10.1109/dtis.2015.7127349}
}RIS
TY - JOUR TI - Scan-chain intra-cell defects grading AU - A. Touati AU - A. Bosio AU - L. Dilillo AU - P. Girard AU - A. Virazel AU - P. Bernardi AU - M. Sonza Reorda PY - 2015 JO - 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) DO - 10.1109/dtis.2015.7127349 UR - https://doi.org/10.1109/dtis.2015.7127349 ER -
APA
Touati, A., Bosio, A., Dilillo, L., Girard, P., Virazel, A., Bernardi, P., & Reorda, M. S. (2015). Scan-chain intra-cell defects grading. 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). https://doi.org/10.1109/dtis.2015.7127349
Source records
- crossref · retrieved 2026-11-03T20:16:00.208Z