Process variability influence on complementary organic circuits characterictics

Mathieu Guerin, Emmanuel Bergeret, Evangeline Benevent, Philippe Pannier, Anis Daami, Romain Coppard

Open source

DOI
10.1109/edssc.2013.6628069
Published
2013-06
Container
2013 IEEE International Conference of Electron Devices and Solid-state Circuits
Publisher
IEEE
Open access
unknown

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BibTeX

@article{allodium:10.1109/edssc.2013.6628069,
  title = {Process variability influence on complementary organic circuits characterictics},
  author = {Mathieu Guerin and Emmanuel Bergeret and Evangeline Benevent and Philippe Pannier and Anis Daami and Romain Coppard},
  year = {2013},
  journal = {2013 IEEE International Conference of Electron Devices and Solid-state Circuits},
  doi = {10.1109/edssc.2013.6628069},
  url = {https://doi.org/10.1109/edssc.2013.6628069}
}

RIS

TY  - JOUR
TI  - Process variability influence on complementary organic circuits characterictics
AU  - Mathieu Guerin
AU  - Emmanuel Bergeret
AU  - Evangeline Benevent
AU  - Philippe Pannier
AU  - Anis Daami
AU  - Romain Coppard
PY  - 2013
JO  - 2013 IEEE International Conference of Electron Devices and Solid-state Circuits
DO  - 10.1109/edssc.2013.6628069
UR  - https://doi.org/10.1109/edssc.2013.6628069
ER  - 

APA

Guerin, M., Bergeret, E., Benevent, E., Pannier, P., Daami, A., & Coppard, R. (2013). Process variability influence on complementary organic circuits characterictics. 2013 IEEE International Conference of Electron Devices and Solid-state Circuits. https://doi.org/10.1109/edssc.2013.6628069

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