In situ defect recognition analysis on long cables through nondestructive reflectometry and dielectric spectroscopy methods: a comparison

Simone Vincenzo Suraci, Davide Fabiani, Josy Cohen

Open source

DOI: 10.1109/eic47619.2020.9158583
Published: 2020-06
Container: 2020 IEEE Electrical Insulation Conference (EIC)
Publisher: IEEE
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/eic47619.2020.9158583,
  title = {In situ defect recognition analysis on long cables through nondestructive reflectometry and dielectric spectroscopy methods: a comparison},
  author = {Simone Vincenzo Suraci and Davide Fabiani and Josy Cohen},
  year = {2020},
  journal = {2020 IEEE Electrical Insulation Conference (EIC)},
  doi = {10.1109/eic47619.2020.9158583},
  url = {https://doi.org/10.1109/eic47619.2020.9158583}
}

RIS

TY  - JOUR
TI  - In situ defect recognition analysis on long cables through nondestructive reflectometry and dielectric spectroscopy methods: a comparison
AU  - Simone Vincenzo Suraci
AU  - Davide Fabiani
AU  - Josy Cohen
PY  - 2020
JO  - 2020 IEEE Electrical Insulation Conference (EIC)
DO  - 10.1109/eic47619.2020.9158583
UR  - https://doi.org/10.1109/eic47619.2020.9158583
ER  -

APA

Suraci, S. V., Fabiani, D., & Cohen, J. (2020). In situ defect recognition analysis on long cables through nondestructive reflectometry and dielectric spectroscopy methods: a comparison. 2020 IEEE Electrical Insulation Conference (EIC). https://doi.org/10.1109/eic47619.2020.9158583

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crossref · retrieved 2026-09-25T19:28:39.363Z