Wafer level characterization of high channel count Optical Phased Array
- DOI
- 10.1109/gfp51802.2021.9674016
- Published
- 2021-12-07
- Container
- Not recorded
- Publisher
- IEEE
- Open access
- no
Credibility signals
limited evidence Score 49/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- cautionDOI registered: No matching Crossref record was present in this response.
- cautionDOI resolves: No matching Crossref record was present in this response.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1109/gfp51802.2021.9674016,
title = {Wafer level characterization of high channel count Optical Phased Array},
author = {Sylvain Guerber and Daivid Fowler and Jonathan Faugier-Tovar and Philippe Grosse and Jerome Meilhan and Kim Abdoul Karim and Jean Hue and Baptiste Delplanque and Francois Simoens and Bertand Szelag},
year = {2021},
doi = {10.1109/gfp51802.2021.9674016},
url = {https://doi.org/10.1109/gfp51802.2021.9674016}
}RIS
TY - JOUR TI - Wafer level characterization of high channel count Optical Phased Array AU - Sylvain Guerber AU - Daivid Fowler AU - Jonathan Faugier-Tovar AU - Philippe Grosse AU - Jerome Meilhan AU - Kim Abdoul Karim AU - Jean Hue AU - Baptiste Delplanque AU - Francois Simoens AU - Bertand Szelag PY - 2021 DO - 10.1109/gfp51802.2021.9674016 UR - https://doi.org/10.1109/gfp51802.2021.9674016 ER -
APA
Guerber, S., Fowler, D., Faugier-Tovar, J., Grosse, P., Meilhan, J., Karim, K. A., Hue, J., Delplanque, B., Simoens, F., & Szelag, B. (2021). Wafer level characterization of high channel count Optical Phased Array. https://doi.org/10.1109/gfp51802.2021.9674016
Source records
- hal · retrieved 2026-09-26T18:22:11.958Z