Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field
- DOI
- 10.1109/icd59037.2024.10613034
- Published
- 2024-06-30
- Container
- 2024 IEEE 5th International Conference on Dielectrics (ICD)
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/icd59037.2024.10613034,
title = {Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field},
author = {Dongxin He and Haochen Wang and Teng Gao and Qingquan Li and Gilbert Teyssedre},
year = {2024},
journal = {2024 IEEE 5th International Conference on Dielectrics (ICD)},
doi = {10.1109/icd59037.2024.10613034},
url = {https://doi.org/10.1109/icd59037.2024.10613034}
}RIS
TY - JOUR TI - Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field AU - Dongxin He AU - Haochen Wang AU - Teng Gao AU - Qingquan Li AU - Gilbert Teyssedre PY - 2024 JO - 2024 IEEE 5th International Conference on Dielectrics (ICD) DO - 10.1109/icd59037.2024.10613034 UR - https://doi.org/10.1109/icd59037.2024.10613034 ER -
APA
He, D., Wang, H., Gao, T., Li, Q., & Teyssedre, G. (2024). Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field. 2024 IEEE 5th International Conference on Dielectrics (ICD). https://doi.org/10.1109/icd59037.2024.10613034
Source records
- crossref · retrieved 2026-09-26T01:06:02.187Z