Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field

Dongxin He, Haochen Wang, Teng Gao, Qingquan Li, Gilbert Teyssedre

Open source

DOI
10.1109/icd59037.2024.10613034
Published
2024-06-30
Container
2024 IEEE 5th International Conference on Dielectrics (ICD)
Publisher
IEEE
Open access
unknown

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BibTeX

@article{allodium:10.1109/icd59037.2024.10613034,
  title = {Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field},
  author = {Dongxin He and Haochen Wang and Teng Gao and Qingquan Li and Gilbert Teyssedre},
  year = {2024},
  journal = {2024 IEEE 5th International Conference on Dielectrics (ICD)},
  doi = {10.1109/icd59037.2024.10613034},
  url = {https://doi.org/10.1109/icd59037.2024.10613034}
}

RIS

TY  - JOUR
TI  - Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field
AU  - Dongxin He
AU  - Haochen Wang
AU  - Teng Gao
AU  - Qingquan Li
AU  - Gilbert Teyssedre
PY  - 2024
JO  - 2024 IEEE 5th International Conference on Dielectrics (ICD)
DO  - 10.1109/icd59037.2024.10613034
UR  - https://doi.org/10.1109/icd59037.2024.10613034
ER  - 

APA

He, D., Wang, H., Gao, T., Li, Q., & Teyssedre, G. (2024). Study on Accelerated Deterioration and Early Failure Mechanism of Silicone Elastomers Under Nanosecond Pulsed Electric Field. 2024 IEEE 5th International Conference on Dielectrics (ICD). https://doi.org/10.1109/icd59037.2024.10613034

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