Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement
- DOI
- 10.1109/icici-bme.2009.5417218
- Published
- 2009-11
- Container
- International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/icici-bme.2009.5417218,
title = {Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement},
author = {Riska Ekawita and Endah Rahmawati and K. Mikrajuddin Abdullah},
year = {2009},
journal = {International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009},
doi = {10.1109/icici-bme.2009.5417218},
url = {https://doi.org/10.1109/icici-bme.2009.5417218}
}RIS
TY - JOUR TI - Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement AU - Riska Ekawita AU - Endah Rahmawati AU - K. Mikrajuddin Abdullah PY - 2009 JO - International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009 DO - 10.1109/icici-bme.2009.5417218 UR - https://doi.org/10.1109/icici-bme.2009.5417218 ER -
APA
Ekawita, R., Rahmawati, E., & Abdullah, K. M. (2009). Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement. International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009. https://doi.org/10.1109/icici-bme.2009.5417218
Source records
- crossref · retrieved 2026-09-27T12:22:33.830Z