Steganalysis by ensemble classifiers with boosting by regression, and post-selection of features

Marc Chaumont, Sarra Kouider

Open source

DOI
10.1109/icip.2012.6467064
Published
2012-09
Container
2012 19th IEEE International Conference on Image Processing
Publisher
IEEE
Open access
unknown

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BibTeX

@article{allodium:10.1109/icip.2012.6467064,
  title = {Steganalysis by ensemble classifiers with boosting by regression, and post-selection of features},
  author = {Marc Chaumont and Sarra Kouider},
  year = {2012},
  journal = {2012 19th IEEE International Conference on Image Processing},
  doi = {10.1109/icip.2012.6467064},
  url = {https://doi.org/10.1109/icip.2012.6467064}
}

RIS

TY  - JOUR
TI  - Steganalysis by ensemble classifiers with boosting by regression, and post-selection of features
AU  - Marc Chaumont
AU  - Sarra Kouider
PY  - 2012
JO  - 2012 19th IEEE International Conference on Image Processing
DO  - 10.1109/icip.2012.6467064
UR  - https://doi.org/10.1109/icip.2012.6467064
ER  - 

APA

Chaumont, M., & Kouider, S. (2012). Steganalysis by ensemble classifiers with boosting by regression, and post-selection of features. 2012 19th IEEE International Conference on Image Processing. https://doi.org/10.1109/icip.2012.6467064

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