Recursive Feature Elimination by Sensitivity Testing.

Escanilla NS, Hellerstein L, Kleiman R, Kuang Z, Shull JD, Page D

Open source

DOI
10.1109/icmla.2018.00014
Published
2018 Dec
Container
Proceedings of the ... International Conference on Machine Learning and Applications. International Conference on Machine Learning and Applications
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1109/icmla.2018.00014,
  title = {Recursive Feature Elimination by Sensitivity Testing.},
  author = {Escanilla NS and Hellerstein L and Kleiman R and Kuang Z and Shull JD and Page D},
  year = {2018},
  journal = {Proceedings of the ... International Conference on Machine Learning and Applications. International Conference on Machine Learning and Applications},
  doi = {10.1109/icmla.2018.00014},
  url = {https://doi.org/10.1109/icmla.2018.00014}
}

RIS

TY  - JOUR
TI  - Recursive Feature Elimination by Sensitivity Testing.
AU  - Escanilla NS
AU  - Hellerstein L
AU  - Kleiman R
AU  - Kuang Z
AU  - Shull JD
AU  - Page D
PY  - 2018
JO  - Proceedings of the ... International Conference on Machine Learning and Applications. International Conference on Machine Learning and Applications
DO  - 10.1109/icmla.2018.00014
UR  - https://doi.org/10.1109/icmla.2018.00014
ER  - 

APA

NS, E., L, H., R, K., Z, K., JD, S., & D, P. (2018). Recursive Feature Elimination by Sensitivity Testing.. Proceedings of the ... International Conference on Machine Learning and Applications. International Conference on Machine Learning and Applications. https://doi.org/10.1109/icmla.2018.00014

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