Properties of SOI-SIMNI films

Dian-Tong Lu, H. Ryssel

Open source

DOI: 10.1109/icsict.1998.785882
Published: Not recorded
Container: 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)
Publisher: IEEE
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/icsict.1998.785882,
  title = {Properties of SOI-SIMNI films},
  author = {Dian-Tong Lu and H. Ryssel},
  journal = {1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)},
  doi = {10.1109/icsict.1998.785882},
  url = {https://doi.org/10.1109/icsict.1998.785882}
}

RIS

TY  - JOUR
TI  - Properties of SOI-SIMNI films
AU  - Dian-Tong Lu
AU  - H. Ryssel
JO  - 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)
DO  - 10.1109/icsict.1998.785882
UR  - https://doi.org/10.1109/icsict.1998.785882
ER  -

APA

Lu, D., & Ryssel, H. (n.d.). Properties of SOI-SIMNI films. 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105). https://doi.org/10.1109/icsict.1998.785882

Source records

crossref · retrieved 2026-09-27T07:48:21.114Z