Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing
- DOI
- 10.1109/iisa52424.2021.9555499
- Published
- 2021-07-12
- Container
- 2021 12th International Conference on Information, Intelligence, Systems & Applications (IISA)
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/iisa52424.2021.9555499,
title = {Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing},
author = {Elpiniki I. Papageorgiou and Theodosis Theodosiou and George Margetis and Nikolaos Dimitriou and Paschalis Charalampous and Dimitrios Tzovaras and Ioannis Samakovlis},
year = {2021},
journal = {2021 12th International Conference on Information, Intelligence, Systems \& Applications (IISA)},
doi = {10.1109/iisa52424.2021.9555499},
url = {https://doi.org/10.1109/iisa52424.2021.9555499}
}RIS
TY - JOUR TI - Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing AU - Elpiniki I. Papageorgiou AU - Theodosis Theodosiou AU - George Margetis AU - Nikolaos Dimitriou AU - Paschalis Charalampous AU - Dimitrios Tzovaras AU - Ioannis Samakovlis PY - 2021 JO - 2021 12th International Conference on Information, Intelligence, Systems & Applications (IISA) DO - 10.1109/iisa52424.2021.9555499 UR - https://doi.org/10.1109/iisa52424.2021.9555499 ER -
APA
Papageorgiou, E. I., Theodosiou, T., Margetis, G., Dimitriou, N., Charalampous, P., Tzovaras, D., & Samakovlis, I. (2021). Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing. 2021 12th International Conference on Information, Intelligence, Systems & Applications (IISA). https://doi.org/10.1109/iisa52424.2021.9555499
Source records
- crossref · retrieved 2026-09-26T07:22:50.008Z