Test and reliability in approximate computing

Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Elena Ioana Vatajelu

Open source

DOI: 10.1109/ims3tw.2017.7995210
Published: 2017-07
Container: 2017 International Mixed Signals Testing Workshop (IMSTW)
Publisher: IEEE
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/ims3tw.2017.7995210,
  title = {Test and reliability in approximate computing},
  author = {Lorena Anghel and Mounir Benabdenbi and Alberto Bosio and Elena Ioana Vatajelu},
  year = {2017},
  journal = {2017 International Mixed Signals Testing Workshop (IMSTW)},
  doi = {10.1109/ims3tw.2017.7995210},
  url = {https://doi.org/10.1109/ims3tw.2017.7995210}
}

RIS

TY  - JOUR
TI  - Test and reliability in approximate computing
AU  - Lorena Anghel
AU  - Mounir Benabdenbi
AU  - Alberto Bosio
AU  - Elena Ioana Vatajelu
PY  - 2017
JO  - 2017 International Mixed Signals Testing Workshop (IMSTW)
DO  - 10.1109/ims3tw.2017.7995210
UR  - https://doi.org/10.1109/ims3tw.2017.7995210
ER  -

APA

Anghel, L., Benabdenbi, M., Bosio, A., & Vatajelu, E. I. (2017). Test and reliability in approximate computing. 2017 International Mixed Signals Testing Workshop (IMSTW). https://doi.org/10.1109/ims3tw.2017.7995210

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crossref · retrieved 2026-09-25T02:13:50.966Z