A smart test controller for scan chains in secure circuits

Jean Da Rolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre

Open source

DOI: 10.1109/iolts.2013.6604085
Published: 2013-07
Container: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
Publisher: IEEE
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1109/iolts.2013.6604085,
  title = {A smart test controller for scan chains in secure circuits},
  author = {Jean Da Rolt and Giorgio Di Natale and Marie-Lise Flottes and Bruno Rouzeyre},
  year = {2013},
  journal = {2013 IEEE 19th International On-Line Testing Symposium (IOLTS)},
  doi = {10.1109/iolts.2013.6604085},
  url = {https://doi.org/10.1109/iolts.2013.6604085}
}

RIS

TY  - JOUR
TI  - A smart test controller for scan chains in secure circuits
AU  - Jean Da Rolt
AU  - Giorgio Di Natale
AU  - Marie-Lise Flottes
AU  - Bruno Rouzeyre
PY  - 2013
JO  - 2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
DO  - 10.1109/iolts.2013.6604085
UR  - https://doi.org/10.1109/iolts.2013.6604085
ER  -

APA

Rolt, J. D., Natale, G. D., Flottes, M., & Rouzeyre, B. (2013). A smart test controller for scan chains in secure circuits. 2013 IEEE 19th International On-Line Testing Symposium (IOLTS). https://doi.org/10.1109/iolts.2013.6604085

Source records

crossref · retrieved 2026-11-04T21:50:43.377Z