Internal field emission study of aluminum base field emitter
- DOI
- 10.1109/ivmc.1998.728757
- Published
- Not recorded
- Container
- Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382)
- Publisher
- IEEE
- Open access
- unknown
Credibility signals
uncertain Score 58/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1109/ivmc.1998.728757,
title = {Internal field emission study of aluminum base field emitter},
author = {Wang Weibiao and Jin Changchun and Chu Zhengsheng and Jiang Jinxiu and Fan Xiwu},
journal = {Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382)},
doi = {10.1109/ivmc.1998.728757},
url = {https://doi.org/10.1109/ivmc.1998.728757}
}RIS
TY - JOUR TI - Internal field emission study of aluminum base field emitter AU - Wang Weibiao AU - Jin Changchun AU - Chu Zhengsheng AU - Jiang Jinxiu AU - Fan Xiwu JO - Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) DO - 10.1109/ivmc.1998.728757 UR - https://doi.org/10.1109/ivmc.1998.728757 ER -
APA
Weibiao, W., Changchun, J., Zhengsheng, C., Jinxiu, J., & Xiwu, F. (n.d.). Internal field emission study of aluminum base field emitter. Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382). https://doi.org/10.1109/ivmc.1998.728757
Source records
- crossref · retrieved 2026-09-26T19:08:17.630Z