Internal field emission study of aluminum base field emitter

Wang Weibiao, Jin Changchun, Chu Zhengsheng, Jiang Jinxiu, Fan Xiwu

Open source

DOI
10.1109/ivmc.1998.728757
Published
Not recorded
Container
Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382)
Publisher
IEEE
Open access
unknown

Credibility signals

uncertain Score 58/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1109/ivmc.1998.728757,
  title = {Internal field emission study of aluminum base field emitter},
  author = {Wang Weibiao and Jin Changchun and Chu Zhengsheng and Jiang Jinxiu and Fan Xiwu},
  journal = {Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382)},
  doi = {10.1109/ivmc.1998.728757},
  url = {https://doi.org/10.1109/ivmc.1998.728757}
}

RIS

TY  - JOUR
TI  - Internal field emission study of aluminum base field emitter
AU  - Wang Weibiao
AU  - Jin Changchun
AU  - Chu Zhengsheng
AU  - Jiang Jinxiu
AU  - Fan Xiwu
JO  - Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382)
DO  - 10.1109/ivmc.1998.728757
UR  - https://doi.org/10.1109/ivmc.1998.728757
ER  - 

APA

Weibiao, W., Changchun, J., Zhengsheng, C., Jinxiu, J., & Xiwu, F. (n.d.). Internal field emission study of aluminum base field emitter. Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382). https://doi.org/10.1109/ivmc.1998.728757

Source records