Effective defect management strategies for emerging fab needs

R.K. Nurani

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DOI: 10.1109/iwstm.2001.933821
Published: Not recorded
Container: 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550)
Publisher: IEEE
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/iwstm.2001.933821,
  title = {Effective defect management strategies for emerging fab needs},
  author = {R.K. Nurani},
  journal = {2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550)},
  doi = {10.1109/iwstm.2001.933821},
  url = {https://doi.org/10.1109/iwstm.2001.933821}
}

RIS

TY  - JOUR
TI  - Effective defect management strategies for emerging fab needs
AU  - R.K. Nurani
JO  - 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550)
DO  - 10.1109/iwstm.2001.933821
UR  - https://doi.org/10.1109/iwstm.2001.933821
ER  -

APA

Nurani, R. (n.d.). Effective defect management strategies for emerging fab needs. 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550). https://doi.org/10.1109/iwstm.2001.933821

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crossref · retrieved 2026-11-10T16:48:26.839Z