Quality in Simulation-Only Manuscripts Submitted to J-EDS
- DOI
- 10.1109/jeds.2021.3072469
- Published
- 2021
- Container
- IEEE Journal of the Electron Devices Society
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
Credibility signals
uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1109/jeds.2021.3072469,
title = {Quality in Simulation-Only Manuscripts Submitted to J-EDS},
author = {Enrico Sangiorgi},
year = {2021},
journal = {IEEE Journal of the Electron Devices Society},
doi = {10.1109/jeds.2021.3072469},
url = {https://doi.org/10.1109/jeds.2021.3072469}
}RIS
TY - JOUR TI - Quality in Simulation-Only Manuscripts Submitted to J-EDS AU - Enrico Sangiorgi PY - 2021 JO - IEEE Journal of the Electron Devices Society DO - 10.1109/jeds.2021.3072469 UR - https://doi.org/10.1109/jeds.2021.3072469 ER -
APA
Sangiorgi, E. (2021). Quality in Simulation-Only Manuscripts Submitted to J-EDS. IEEE Journal of the Electron Devices Society. https://doi.org/10.1109/jeds.2021.3072469
Source records
- crossref · retrieved 2026-09-25T12:52:47.879Z