Direct Defect-Level Analysis of Metal–Insulator–Metal Capacitor Using Internal Photoemission Spectroscopy
- DOI
- 10.1109/jeds.2021.3073220
- Published
- 2021
- Container
- IEEE Journal of the Electron Devices Society
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
Credibility signals
uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- supportingDOI registered: A matching record was returned by Crossref.
- supportingDOI resolves: A matching record was returned by Crossref.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1109/jeds.2021.3073220,
title = {Direct Defect-Level Analysis of Metal–Insulator–Metal Capacitor Using Internal Photoemission Spectroscopy},
author = {Tae Jin Yoo and Hyeon Jun Hwang and Soo Cheol Kang and Sunwoo Heo and Ho-In Lee and Young Gon Lee and Hokyung Park and Byoung Hun Lee},
year = {2021},
journal = {IEEE Journal of the Electron Devices Society},
doi = {10.1109/jeds.2021.3073220},
url = {https://doi.org/10.1109/jeds.2021.3073220}
}RIS
TY - JOUR TI - Direct Defect-Level Analysis of Metal–Insulator–Metal Capacitor Using Internal Photoemission Spectroscopy AU - Tae Jin Yoo AU - Hyeon Jun Hwang AU - Soo Cheol Kang AU - Sunwoo Heo AU - Ho-In Lee AU - Young Gon Lee AU - Hokyung Park AU - Byoung Hun Lee PY - 2021 JO - IEEE Journal of the Electron Devices Society DO - 10.1109/jeds.2021.3073220 UR - https://doi.org/10.1109/jeds.2021.3073220 ER -
APA
Yoo, T. J., Hwang, H. J., Kang, S. C., Heo, S., Lee, H., Lee, Y. G., Park, H., & Lee, B. H. (2021). Direct Defect-Level Analysis of Metal–Insulator–Metal Capacitor Using Internal Photoemission Spectroscopy. IEEE Journal of the Electron Devices Society. https://doi.org/10.1109/jeds.2021.3073220
Source records
- crossref · retrieved 2026-09-27T04:04:41.697Z