Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System
- DOI
- 10.1109/jsen.2020.2970599
- Published
- 2020-05-15
- Container
- IEEE Sensors Journal
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/jsen.2020.2970599,
title = {Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System},
author = {Olivier D. Bernal and Usman Zabit and Francis Jayat and Thierry Bosch},
year = {2020},
journal = {IEEE Sensors Journal},
doi = {10.1109/jsen.2020.2970599},
url = {https://doi.org/10.1109/jsen.2020.2970599}
}RIS
TY - JOUR TI - Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System AU - Olivier D. Bernal AU - Usman Zabit AU - Francis Jayat AU - Thierry Bosch PY - 2020 JO - IEEE Sensors Journal DO - 10.1109/jsen.2020.2970599 UR - https://doi.org/10.1109/jsen.2020.2970599 ER -
APA
Bernal, O. D., Zabit, U., Jayat, F., & Bosch, T. (2020). Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System. IEEE Sensors Journal. https://doi.org/10.1109/jsen.2020.2970599
Source records
- crossref · retrieved 2026-09-25T18:31:45.306Z